Nanoelectromechanical relay without pull-in instability for high-temperature non-volatile memory

Designing reliable, scalable and energy efficient data storage systems that can operate in extreme temperatures, remains a challenge. Here, the authors demonstrate a nanoelectromechanical relay that does not exhibit pull-in instability for reliable reprogrammable non-volatile memory operation.

Guardado en:
Detalles Bibliográficos
Autores principales: Sunil Rana, João Mouro, Simon J. Bleiker, Jamie D. Reynolds, Harold M. H. Chong, Frank Niklaus, Dinesh Pamunuwa
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2020
Materias:
Q
Acceso en línea:https://doaj.org/article/cd02115f3edd495195a75deb48ec3df2
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!