Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks

Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks

Nowadays, many electronic systems store valuable Intellectual Property (IP) information inside Non-Volatile Memories (NVMs). Designers widely use encryption mechanisms to enhance the integrity of such IPs and protect them from any unauthorized access or modification. At the same time, often such IPs...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea
Formato: article
Lenguaje:EN
Publicado: IEEE 2021
Materias:
Artificial neural networks
convolutional neural networks
encryption
fault detection
fault injection
non-volatile memories
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Acceso en línea:https://doaj.org/article/ce17281b886a4d419a89839ecce4c9ba
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Internet

https://doaj.org/article/ce17281b886a4d419a89839ecce4c9ba

Ejemplares similares