Direct observation of multiple rotational stacking faults coexisting in freestanding bilayer MoS2

Abstract Electronic properties of two-dimensional (2D) MoS2 semiconductors can be modulated by introducing specific defects. One important type of defect in 2D layered materials is known as rotational stacking fault (RSF), but the coexistence of multiple RSFs with different rotational angles was not...

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Autores principales: Zuocheng Li, Xingxu Yan, Zhenkun Tang, Ziyang Huo, Guoliang Li, Liying Jiao, Li-Min Liu, Miao Zhang, Jun Luo, Jing Zhu
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/dae1a19d15474b04a2ab513d95e1f4ad
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