Symmetric mean and directional contour pattern for texture classification

Abstract In this letter, we propose a simple yet effective texture descriptor, symmetric mean and directional contour pattern (SMDCP), for texture classification. In particular, first the robust symmetric mean pattern (RSMP) that extracts the sign and amplitude information of the local difference th...

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Autores principales: Yongsheng Dong, Boshi Zheng, Hong Liu, Zhiyong Zhang, Zhumu Fu
Formato: article
Lenguaje:EN
Publicado: Wiley 2021
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Acceso en línea:https://doaj.org/article/dd3047bcb2a54f94a8be08c3b5a7ca67
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