Symmetric mean and directional contour pattern for texture classification

Abstract In this letter, we propose a simple yet effective texture descriptor, symmetric mean and directional contour pattern (SMDCP), for texture classification. In particular, first the robust symmetric mean pattern (RSMP) that extracts the sign and amplitude information of the local difference th...

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Autores principales:	Yongsheng Dong, Boshi Zheng, Hong Liu, Zhiyong Zhang, Zhumu Fu
Formato:	article
Lenguaje:	EN
Publicado:	Wiley 2021
Materias:	Electrical engineering. Electronics. Nuclear engineering TK1-9971
Acceso en línea:	https://doaj.org/article/dd3047bcb2a54f94a8be08c3b5a7ca67
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spelling	oai:doaj.org-article:dd3047bcb2a54f94a8be08c3b5a7ca672021-11-19T05:42:54ZSymmetric mean and directional contour pattern for texture classification1350-911X0013-519410.1049/ell2.12310https://doaj.org/article/dd3047bcb2a54f94a8be08c3b5a7ca672021-11-01T00:00:00Zhttps://doi.org/10.1049/ell2.12310https://doaj.org/toc/0013-5194https://doaj.org/toc/1350-911XAbstract In this letter, we propose a simple yet effective texture descriptor, symmetric mean and directional contour pattern (SMDCP), for texture classification. In particular, first the robust symmetric mean pattern (RSMP) that extracts the sign and amplitude information of the local difference through the neighbourhood average in a new scheme of encoding to further enhance the robustness to noise is constructed. Then a local directional and contour pattern (LDCP) to represent the contour information and direction information of adjacent sampling points is extracted. By concatenating the RSMP and LDCP, a robust and effective texture descriptor (SMDCP) for classification is built. Experimental results reveal that the proposed method obtains significant performance and high discrimination in comparison with 10 representative approaches.Yongsheng DongBoshi ZhengHong LiuZhiyong ZhangZhumu FuWileyarticleElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENElectronics Letters, Vol 57, Iss 24, Pp 918-920 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Electrical engineering. Electronics. Nuclear engineering TK1-9971
spellingShingle	Electrical engineering. Electronics. Nuclear engineering TK1-9971 Yongsheng Dong Boshi Zheng Hong Liu Zhiyong Zhang Zhumu Fu Symmetric mean and directional contour pattern for texture classification
description	Abstract In this letter, we propose a simple yet effective texture descriptor, symmetric mean and directional contour pattern (SMDCP), for texture classification. In particular, first the robust symmetric mean pattern (RSMP) that extracts the sign and amplitude information of the local difference through the neighbourhood average in a new scheme of encoding to further enhance the robustness to noise is constructed. Then a local directional and contour pattern (LDCP) to represent the contour information and direction information of adjacent sampling points is extracted. By concatenating the RSMP and LDCP, a robust and effective texture descriptor (SMDCP) for classification is built. Experimental results reveal that the proposed method obtains significant performance and high discrimination in comparison with 10 representative approaches.
format	article
author	Yongsheng Dong Boshi Zheng Hong Liu Zhiyong Zhang Zhumu Fu
author_facet	Yongsheng Dong Boshi Zheng Hong Liu Zhiyong Zhang Zhumu Fu
author_sort	Yongsheng Dong
title	Symmetric mean and directional contour pattern for texture classification
title_short	Symmetric mean and directional contour pattern for texture classification
title_full	Symmetric mean and directional contour pattern for texture classification
title_fullStr	Symmetric mean and directional contour pattern for texture classification
title_full_unstemmed	Symmetric mean and directional contour pattern for texture classification
title_sort	symmetric mean and directional contour pattern for texture classification
publisher	Wiley
publishDate	2021
url	https://doaj.org/article/dd3047bcb2a54f94a8be08c3b5a7ca67
work_keys_str_mv	AT yongshengdong symmetricmeananddirectionalcontourpatternfortextureclassification AT boshizheng symmetricmeananddirectionalcontourpatternfortextureclassification AT hongliu symmetricmeananddirectionalcontourpatternfortextureclassification AT zhiyongzhang symmetricmeananddirectionalcontourpatternfortextureclassification AT zhumufu symmetricmeananddirectionalcontourpatternfortextureclassification
_version_	1718420405763440640

Symmetric mean and directional contour pattern for texture classification

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