Noise-robust classification of single-shot electron spin readouts using a deep neural network

Abstract Single-shot readout of charge and spin states by charge sensors such as quantum point contacts and quantum dots are essential technologies for the operation of semiconductor spin qubits. The fidelity of the single-shot readout depends both on experimental conditions such as signal-to-noise...

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Autores principales: Yuta Matsumoto, Takafumi Fujita, Arne Ludwig, Andreas D. Wieck, Kazunori Komatani, Akira Oiwa
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/e073c3ef709c42d6bdcb1d1cbc4dd41d
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