Deformation behavior of Re alloyed Mo thin films on flexible substrates: In situ fragmentation analysis supported by first-principles calculations

Abstract A major obstacle in the utilization of Mo thin films in flexible electronics is their brittle fracture behavior. Within this study, alloying with Re is explored as a potential strategy to improve the resistance to fracture. The sputter-deposited Mo1−xRex films (with 0 ≤ x ≤ 0.31) were chara...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Tanja Jörg, Denis Music, Filipe Hauser, Megan J. Cordill, Robert Franz, Harald Köstenbauer, Jörg Winkler, Jochen M. Schneider, Christian Mitterer
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
Materias:
R
Q
Acceso en línea:https://doaj.org/article/e2b4673aca9b405597316078b3ce50a7
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!