Experimentally investigating the performance degradations of the CMOS PA at different temperatures

To investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temp...

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Autores principales:	Zhao He, Shaohua Zhou, Meining Nie
Formato:	article
Lenguaje:	EN
Publicado:	AIP Publishing LLC 2021
Materias:	Physics QC1-999
Acceso en línea:	https://doaj.org/article/e350eaaeffa64f5dae1021cc5a49782e
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spelling	oai:doaj.org-article:e350eaaeffa64f5dae1021cc5a49782e2021-12-01T18:52:06ZExperimentally investigating the performance degradations of the CMOS PA at different temperatures2158-322610.1063/5.0071801https://doaj.org/article/e350eaaeffa64f5dae1021cc5a49782e2021-11-01T00:00:00Zhttp://dx.doi.org/10.1063/5.0071801https://doaj.org/toc/2158-3226To investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temperature changes. The main reasons for these degradations are discussed and analyzed in this paper. The research performed in the study provides another angle to handle the practical working environments rather than the extreme cases as the reliability study.Zhao HeShaohua ZhouMeining NieAIP Publishing LLCarticlePhysicsQC1-999ENAIP Advances, Vol 11, Iss 11, Pp 115205-115205-7 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Physics QC1-999
spellingShingle	Physics QC1-999 Zhao He Shaohua Zhou Meining Nie Experimentally investigating the performance degradations of the CMOS PA at different temperatures
description	To investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temperature changes. The main reasons for these degradations are discussed and analyzed in this paper. The research performed in the study provides another angle to handle the practical working environments rather than the extreme cases as the reliability study.
format	article
author	Zhao He Shaohua Zhou Meining Nie
author_facet	Zhao He Shaohua Zhou Meining Nie
author_sort	Zhao He
title	Experimentally investigating the performance degradations of the CMOS PA at different temperatures
title_short	Experimentally investigating the performance degradations of the CMOS PA at different temperatures
title_full	Experimentally investigating the performance degradations of the CMOS PA at different temperatures
title_fullStr	Experimentally investigating the performance degradations of the CMOS PA at different temperatures
title_full_unstemmed	Experimentally investigating the performance degradations of the CMOS PA at different temperatures
title_sort	experimentally investigating the performance degradations of the cmos pa at different temperatures
publisher	AIP Publishing LLC
publishDate	2021
url	https://doaj.org/article/e350eaaeffa64f5dae1021cc5a49782e
work_keys_str_mv	AT zhaohe experimentallyinvestigatingtheperformancedegradationsofthecmospaatdifferenttemperatures AT shaohuazhou experimentallyinvestigatingtheperformancedegradationsofthecmospaatdifferenttemperatures AT meiningnie experimentallyinvestigatingtheperformancedegradationsofthecmospaatdifferenttemperatures
_version_	1718404662023946240

Experimentally investigating the performance degradations of the CMOS PA at different temperatures

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