Ferroelectric Hafnium Nitride Thin Films Directly Formed on Si(100) Substrate

We have investigated the ferroelectric hafnium nitride (HfN) thin films directly formed on the Si(100) substrate for the metal-ferroelectrics-Si field-effect transistor (MFSFET) applications. The 10 nm thick rhombohedral phase HfN layer was found to be formed on the Si(100) substrate utilizing the p...

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Autores principales: S. Ohmi, Y. Ohtaguchi, A. Ihara, H. Morita
Formato: article
Lenguaje:EN
Publicado: IEEE 2021
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Acceso en línea:https://doaj.org/article/e4f333fec4944a6bbd02b40314194748
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