Preventing Scan-Based Side-Channel Attacks by Scan Obfuscating with a Configurable Shift Register
Scan test is widely used in integrated circuit test. However, the excellent observability and controllability provided by the scan test gives attackers an opportunity to obtain sensitive information by using scan design to threaten circuit security. Hence, the primary motivation of this paper is to...
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| Autores principales: | , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Hindawi-Wiley
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/e75e4f6bd0d0467396d0d259326e9df5 |
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