Operando SXRD study of the structure and growth process of Cu2S ultra-thin films
Abstract Electrochemical Atomic Layer Deposition (E-ALD) technique has demonstrated to be a suitable process for growing compound semiconductors, by alternating the under-potential deposition (UPD) of the metallic element with the UPD of the non-metallic element. The cycle can be repeated several ti...
Enregistré dans:
Auteurs principaux: | Andrea Giaccherini, Serena Cinotti, Annalisa Guerri, Francesco Carlà, Giordano Montegrossi, Francesco Vizza, Alessandro Lavacchi, Roberto Felici, Francesco Di Benedetto, Massimo Innocenti |
---|---|
Format: | article |
Langue: | EN |
Publié: |
Nature Portfolio
2017
|
Sujets: | |
Accès en ligne: | https://doaj.org/article/e7e9d78f6f7e46179762022f3323b022 |
Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|
Documents similaires
-
Spin-states in MoS2 thin-film transistors distinguished by operando electron spin resonance
par: Naho Tsunetomo, et autres
Publié: (2021) -
Ultra-high critical current densities of superconducting YBa2Cu3O7-δ thin films in the overdoped state
par: A. Stangl, et autres
Publié: (2021) -
Operando high-pressure investigation of size-controlled CuZn catalysts for the methanol synthesis reaction
par: Núria J. Divins, et autres
Publié: (2021) -
Ultra-low damping insulating magnetic thin films get perpendicular
par: Lucile Soumah, et autres
Publié: (2018) -
Cobalt Oxide Diffusion Kinetics in Ultra-Thin Amorphous Carbon Films
par: Robert J. Waltman
Publié: (2019)