Liu, J., Huang, Z., Conway, P. P., & Liu, Y. (2019). Processing-Structure-Protrusion Relationship of 3-D Cu TSVs: Control at the Atomic Scale. IEEE.
Style de citation Chicago (17e éd.)Liu, Jinxin, Zhiheng Huang, Paul P. Conway, et Yang Liu. Processing-Structure-Protrusion Relationship of 3-D Cu TSVs: Control at the Atomic Scale. IEEE, 2019.
Style de citation MLA (8e éd.)Liu, Jinxin, et al. Processing-Structure-Protrusion Relationship of 3-D Cu TSVs: Control at the Atomic Scale. IEEE, 2019.
Attention : ces citations peuvent ne pas être correctes à 100%.