The X-ray Sensitivity of an Amorphous Lead Oxide Photoconductor

The photoconductor layer is an important component of direct conversion flat panel X-ray imagers (FPXI); thus, it should be carefully selected to meet the requirements for the X-ray imaging detector, and its properties should be clearly understood to develop the most optimal detector design. Current...

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Autores principales: Oleksandr Grynko, Tristen Thibault, Emma Pineau, Alla Reznik
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/ec9a7f0197154f28b71200b3481b90bf
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