Upconverted electroluminescence via Auger scattering of interlayer excitons in van der Waals heterostructures

The authors present electroluminescence measurements of light-emitting devices based on van der Waals heterostructures, and observe a lower than expected threshold voltage for intralayer electroluminescence, attributed to non-radiative Auger-type recombination of interlayer excitons and resulting en...

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Autores principales: J. Binder, J. Howarth, F. Withers, M. R. Molas, T. Taniguchi, K. Watanabe, C. Faugeras, A. Wysmolek, M. Danovich, V. I. Fal’ko, A. K. Geim, K. S. Novoselov, M. Potemski, A. Kozikov
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Acceso en línea:https://doaj.org/article/f0e07b892c39407c8302d9e0bf40da58
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