Experimental measurements of Xe and Kr releases from UO2 and determination of their migration mechanisms – Release rate data

We present the raw data obtained from release rate at 1300°C of Xe and Kr implanted in UO2, related to [1]. We performed different sample preparation (polishing treatment) on polycrystalline and monocrystalline UO2. Ion implantation were performed at various fluences between 9.5 × 1010 to 5 × 1014 i...

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Bibliographic Details
Main Authors: M. Gérardin, E. Gilabert, D. Horlait, M-F. Barthe, G. Carlot
Format: article
Language:EN
Published: Elsevier 2021
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Online Access:https://doaj.org/article/fc97ab6659754199a7e6a6e0248dbb01
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