Electrically reversible cracks in an intermetallic film controlled by an electric field

Electrically reversible cracks in an intermetallic film controlled by an electric field

Electric-field-induced cracks are generally detrimental to functionality of ferroelectric ceramics. Liu et al. use an intermetallic alloy and ferroelectric oxide junction to mediate the reversible formation of cracks at nanoscales, resulting in colossal electroresistance modulation for memory applic...

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Bibliographic Details
Main Authors: Z. Q. Liu, J. H. Liu, M. D. Biegalski, J.-M. Hu, S. L. Shang, Y. Ji, J. M. Wang, S. L. Hsu, A. T. Wong, M. J. Cordill, B. Gludovatz, C. Marker, H. Yan, Z. X. Feng, L. You, M. W. Lin, T. Z. Ward, Z. K. Liu, C. B. Jiang, L. Q. Chen, R. O. Ritchie, H. M. Christen, R. Ramesh
Format: article
Language:EN
Published: Nature Portfolio 2018
Subjects:
Science
Q
Online Access:https://doaj.org/article/ffb9973e1ed645078b4f227d83caeac4
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