Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

par Randall L. Headrick, Jeffrey G. Ulbrandt, Peco Myint, Jing Wan, Yang Li, Andrei Fluerasu, Yugang Zhang, Lutz Wiegart, Karl F. Ludwig
Publié 2019

Role of ferroelectric polarization during growth of highly strained ferroelectric materials

par Rui Liu, Jeffrey G. Ulbrandt, Hsiang-Chun Hsing, Anna Gura, Benjamin Bein, Alec Sun, Charles Pan, Giulia Bertino, Amanda Lai, Kaize Cheng, Eli Doyle, Kenneth Evans-Lutterodt, Randall L. Headrick, Matthew Dawber
Publié 2020