Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors
Atomically thin transition metal dichalcogenides offer a platform to explore the valley degree of freedom originating from their electronic band structure. Here, the authors use polarization- and time-resolved spectroscopy to investigate the temperature-dependent valley pseudospin relaxation process...
Saved in:
| Main Authors: | , , , , , , , , , , |
|---|---|
| Format: | article |
| Language: | EN |
| Published: |
Nature Portfolio
2018
|
| Subjects: | |
| Online Access: | https://doaj.org/article/082912cf98474f188c610f8ea787a283 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|