Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3

Abstract Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images...

Full description

Saved in:
Bibliographic Details
Main Authors: In-Tae Bae, Tomohiro Ichinose, Myung-Geun Han, Yimei Zhu, Shintaro Yasui, Hiroshi Naganuma
Format: article
Language:EN
Published: Nature Portfolio 2018
Subjects:
R
Q
Online Access:https://doaj.org/article/41d0af5ad2d44f9e86b565ed344d5d95
Tags: Add Tag
No Tags, Be the first to tag this record!