Low-energy Ar+ and N+ ion beam induced chemical vapor deposition using hexamethyldisilazane for the formation of nitrogen containing SiC and carbon containing SiN films.

We proposed an experimental methodology for producing films on substrates with an ion beam induced chemical vapor deposition (IBICVD) method using hexamethyldisilazane (HMDS) as a source material. In this study, both HMDS and ion beam were simultaneously injected onto a Si substrate. We selected Ar+...

Full description

Saved in:
Bibliographic Details
Main Authors: Satoru Yoshimura, Satoshi Sugimoto, Takae Takeuchi, Kensuke Murai, Masato Kiuchi
Format: article
Language:EN
Published: Public Library of Science (PLoS) 2021
Subjects:
R
Q
Online Access:https://doaj.org/article/43bb2e9c11ce460da135b47cbccfa9b5
Tags: Add Tag
No Tags, Be the first to tag this record!