Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.

Tetramethyltin was decomposed in an ion source and the fragment ions produced were identified using a low-energy mass-selected ion beam machine. Dominant fragment ions were found to be H+, CH2+, and Sn+. Subsequently, fragment ions were mass-selected. The mass spectrum of the selected ions indicated...

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Autores principales:	Satoru Yoshimura, Satoshi Sugimoto, Takae Takeuchi, Kensuke Murai, Masato Kiuchi
Formato:	article
Lenguaje:	EN
Publicado:	Public Library of Science (PLoS) 2021
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/656333677c0246b182ef1fa2be03b0b1
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spelling	oai:doaj.org-article:656333677c0246b182ef1fa2be03b0b12021-12-02T20:09:56ZIdentification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.1932-620310.1371/journal.pone.0253870https://doaj.org/article/656333677c0246b182ef1fa2be03b0b12021-01-01T00:00:00Zhttps://doi.org/10.1371/journal.pone.0253870https://doaj.org/toc/1932-6203Tetramethyltin was decomposed in an ion source and the fragment ions produced were identified using a low-energy mass-selected ion beam machine. Dominant fragment ions were found to be H+, CH2+, and Sn+. Subsequently, fragment ions were mass-selected. The mass spectrum of the selected ions indicated that only a single peak appeared at the mass number of 120 u, being suggestive of the presence of 120Sn+ ions. The ion energy was set at the range of 20-100 eV. The Sn+ ion beam was irradiated to a Si substrate, and a film was then found deposited on the substrate after the ion beam irradiation. An X-ray diffraction measurement showed that the film obtained was metallic Sn. Then, the Sn+ ion beam was irradiated to a quartz crystal microbalance substrate. We found that most of the irradiated Sn+ ions were adhered to the substrate, at the ion energy levels of 25 and 58 eV, producing the Sn film, whereas a 107 eV Sn+ beam caused a significant proportion of Sn atoms in the film to detach from the substrate, probably due to sputtering.Satoru YoshimuraSatoshi SugimotoTakae TakeuchiKensuke MuraiMasato KiuchiPublic Library of Science (PLoS)articleMedicineRScienceQENPLoS ONE, Vol 16, Iss 6, p e0253870 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Satoru Yoshimura Satoshi Sugimoto Takae Takeuchi Kensuke Murai Masato Kiuchi Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.
description	Tetramethyltin was decomposed in an ion source and the fragment ions produced were identified using a low-energy mass-selected ion beam machine. Dominant fragment ions were found to be H+, CH2+, and Sn+. Subsequently, fragment ions were mass-selected. The mass spectrum of the selected ions indicated that only a single peak appeared at the mass number of 120 u, being suggestive of the presence of 120Sn+ ions. The ion energy was set at the range of 20-100 eV. The Sn+ ion beam was irradiated to a Si substrate, and a film was then found deposited on the substrate after the ion beam irradiation. An X-ray diffraction measurement showed that the film obtained was metallic Sn. Then, the Sn+ ion beam was irradiated to a quartz crystal microbalance substrate. We found that most of the irradiated Sn+ ions were adhered to the substrate, at the ion energy levels of 25 and 58 eV, producing the Sn film, whereas a 107 eV Sn+ beam caused a significant proportion of Sn atoms in the film to detach from the substrate, probably due to sputtering.
format	article
author	Satoru Yoshimura Satoshi Sugimoto Takae Takeuchi Kensuke Murai Masato Kiuchi
author_facet	Satoru Yoshimura Satoshi Sugimoto Takae Takeuchi Kensuke Murai Masato Kiuchi
author_sort	Satoru Yoshimura
title	Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.
title_short	Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.
title_full	Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.
title_fullStr	Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.
title_full_unstemmed	Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.
title_sort	identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy sn+ ion beam.
publisher	Public Library of Science (PLoS)
publishDate	2021
url	https://doaj.org/article/656333677c0246b182ef1fa2be03b0b1
work_keys_str_mv	AT satoruyoshimura identificationoffragmentionsproducedbythedecompositionoftetramethyltinandtheproductionoflowenergysnionbeam AT satoshisugimoto identificationoffragmentionsproducedbythedecompositionoftetramethyltinandtheproductionoflowenergysnionbeam AT takaetakeuchi identificationoffragmentionsproducedbythedecompositionoftetramethyltinandtheproductionoflowenergysnionbeam AT kensukemurai identificationoffragmentionsproducedbythedecompositionoftetramethyltinandtheproductionoflowenergysnionbeam AT masatokiuchi identificationoffragmentionsproducedbythedecompositionoftetramethyltinandtheproductionoflowenergysnionbeam
_version_	1718375065180962816

Identification of fragment ions produced by the decomposition of tetramethyltin and the production of low-energy Sn+ ion beam.

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