Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
We analyze the loss of contrast in simulated atomic-resolution annular dark-field scan- ning transmission electron microscopy images due to the incoherent thermal diffuse scattering (TDS) for SrTiO3 and PbTiO3 samples. The contribution of TDS in the contrast reduction is evaluated within the TDS...
Enregistré dans:
| Auteur principal: | |
|---|---|
| Format: | article |
| Langue: | EN |
| Publié: |
D.Ghitu Institute of Electronic Engineering and Nanotechnologies
2007
|
| Sujets: | |
| Accès en ligne: | https://doaj.org/article/65f2b2bb933c4b42ac52885fe9c4ad8b |
| Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|
Soyez le premier à ajouter un commentaire!