A nanoscale analysis method to reveal oxygen exchange between environment, oxide, and electrodes in ReRAM devices

The limited sensitivity of existing analysis techniques at the nanometer scale makes it challenging to systematically examine the complex interactions in redox-based resistive random access memory (ReRAM) devices. To test models of oxygen movement in ReRAM devices beyond what has previously been pos...

Full description

Saved in:
Bibliographic Details
Main Authors: Horatio R. J. Cox, Mark Buckwell, Wing H. Ng, Daniel J. Mannion, Adnan Mehonic, Paul R. Shearing, Sarah Fearn, Anthony J. Kenyon
Format: article
Language:EN
Published: AIP Publishing LLC 2021
Subjects:
Online Access:https://doaj.org/article/6fb9ffa027bb410f95376d9d8dd875ab
Tags: Add Tag
No Tags, Be the first to tag this record!