Impact ionization by hot carriers in a black phosphorus field effect transistor
Carrier multiplication processes based on new electron-hole pair generation is instrumental to realizing ultrafast and efficient optoelectronic devices. Here, the authors demonstrate multilayered black phosphorous-based transistors that show enhanced performance due to carrier multiplication.
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Main Authors: | Faisal Ahmed, Young Duck Kim, Zheng Yang, Pan He, Euyheon Hwang, Hyunsoo Yang, James Hone, Won Jong Yoo |
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Format: | article |
Language: | EN |
Published: |
Nature Portfolio
2018
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Subjects: | |
Online Access: | https://doaj.org/article/973b37f190f94a85846d107f805bc6eb |
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