Impact of temperature-dependent series resistance on the operation of AlGaN/GaN high electron mobility transistors

AlGaN/GaN high electron mobility transistors (HEMTs) possess excellent electrical and thermal properties. In this study, we examined the electrical performance of AlGaN/GaN HEMTs to clarify the operational mechanism of the device with temperature variation in an effort to further advance development...

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Auteurs principaux: Dae-Young Jeon, Yumin Koh, Chu-Young Cho, Kyung-Ho Park
Format: article
Langue:EN
Publié: AIP Publishing LLC 2021
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Accès en ligne:https://doaj.org/article/b5ca43ac0b4940ac8a348aef7212a5be
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