Impact of temperature-dependent series resistance on the operation of AlGaN/GaN high electron mobility transistors

por Dae-Young Jeon, Yumin Koh, Chu-Young Cho, Kyung-Ho Park
Publicado 2021

Vertical and bevel-structured SiC etching techniques incorporating different gas mixture plasmas for various microelectronic applications

por Ho-Kun Sung, Tian Qiang, Zhao Yao, Yang Li, Qun Wu, Hee-Kwan Lee, Bum-Doo Park, Woong-Sun Lim, Kyung-Ho Park, Cong Wang
Publicado 2017

Author Correction: A quantitative approach for trap analysis between Al0.25Ga0.75N and GaN in high electron mobility transistors

por Walid Amir, Ju‑Won Shin, Ki‑Yong Shin, Jae‑Moo Kim, Chu‑Young Cho, Kyung‑Ho Park, Takuya Hoshi, Takuya Tsutsumi, Hiroki Sugiyama, Hideaki Matsuzaki, Tae‑Woo Kim
Publicado 2021

A quantitative approach for trap analysis between Al0.25Ga0.75N and GaN in high electron mobility transistors

por Walid Amir, Ju-Won Shin, Ki-Yong Shin, Jae-Moo Kim, Chu-Young Cho, Kyung-Ho Park, Takuya Hoshi, Takuya Tsutsumi, Hiroki Sugiyama, Hideaki Matsuzaki, Tae-Woo Kim
Publicado 2021