Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Monitoring growth dynamics of crystalline thin materials progressively is crucial to understand the mechanism. Here, the authors develop a local step flow model to investigate the growth of C60 films on graphene coated over silicon substrates that correlates the step-edge velocity with its terrace l...

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Autores principales: Randall L. Headrick, Jeffrey G. Ulbrandt, Peco Myint, Jing Wan, Yang Li, Andrei Fluerasu, Yugang Zhang, Lutz Wiegart, Karl F. Ludwig
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Acceso en línea:https://doaj.org/article/5f87a8ca02b44340a084bc33334a9df5
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