Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Monitoring growth dynamics of crystalline thin materials progressively is crucial to understand the mechanism. Here, the authors develop a local step flow model to investigate the growth of C60 films on graphene coated over silicon substrates that correlates the step-edge velocity with its terrace l...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autores principales:	Randall L. Headrick, Jeffrey G. Ulbrandt, Peco Myint, Jing Wan, Yang Li, Andrei Fluerasu, Yugang Zhang, Lutz Wiegart, Karl F. Ludwig
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2019
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/5f87a8ca02b44340a084bc33334a9df5
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

id	oai:doaj.org-article:5f87a8ca02b44340a084bc33334a9df5
record_format	dspace
spelling	oai:doaj.org-article:5f87a8ca02b44340a084bc33334a9df52021-12-02T14:40:20ZCoherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces10.1038/s41467-019-10629-82041-1723https://doaj.org/article/5f87a8ca02b44340a084bc33334a9df52019-06-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-10629-8https://doaj.org/toc/2041-1723Monitoring growth dynamics of crystalline thin materials progressively is crucial to understand the mechanism. Here, the authors develop a local step flow model to investigate the growth of C60 films on graphene coated over silicon substrates that correlates the step-edge velocity with its terrace lengths using the X-ray photon correlation spectroscopy.Randall L. HeadrickJeffrey G. UlbrandtPeco MyintJing WanYang LiAndrei FluerasuYugang ZhangLutz WiegartKarl F. LudwigNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-9 (2019)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Randall L. Headrick Jeffrey G. Ulbrandt Peco Myint Jing Wan Yang Li Andrei Fluerasu Yugang Zhang Lutz Wiegart Karl F. Ludwig Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
description	Monitoring growth dynamics of crystalline thin materials progressively is crucial to understand the mechanism. Here, the authors develop a local step flow model to investigate the growth of C60 films on graphene coated over silicon substrates that correlates the step-edge velocity with its terrace lengths using the X-ray photon correlation spectroscopy.
format	article
author	Randall L. Headrick Jeffrey G. Ulbrandt Peco Myint Jing Wan Yang Li Andrei Fluerasu Yugang Zhang Lutz Wiegart Karl F. Ludwig
author_facet	Randall L. Headrick Jeffrey G. Ulbrandt Peco Myint Jing Wan Yang Li Andrei Fluerasu Yugang Zhang Lutz Wiegart Karl F. Ludwig
author_sort	Randall L. Headrick
title	Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
title_short	Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
title_full	Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
title_fullStr	Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
title_full_unstemmed	Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
title_sort	coherent x-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
publisher	Nature Portfolio
publishDate	2019
url	https://doaj.org/article/5f87a8ca02b44340a084bc33334a9df5
work_keys_str_mv	AT randalllheadrick coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces AT jeffreygulbrandt coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces AT pecomyint coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces AT jingwan coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces AT yangli coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces AT andreifluerasu coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces AT yugangzhang coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces AT lutzwiegart coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces AT karlfludwig coherentxraymeasurementofstepflowpropagationduringgrowthonpolycrystallinethinfilmsurfaces
_version_	1718390297138823168

Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Ejemplares similares