Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
Monitoring growth dynamics of crystalline thin materials progressively is crucial to understand the mechanism. Here, the authors develop a local step flow model to investigate the growth of C60 films on graphene coated over silicon substrates that correlates the step-edge velocity with its terrace l...
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| Autores principales: | , , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2019
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/5f87a8ca02b44340a084bc33334a9df5 |
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